发明名称 Process for fabrication of a planar heterostructure
摘要 <p>The heterostructure has a wafer (3) etched from an upper main surface of a semiconductor substrate. A stack of alternative silicon germanium layers (5, 7) and silicon layers (6, 8) is deposited on the surface and walls, where the number and thickness of the stack depends on final utilization for the heterostructure. The final heterostructure has a plane upper main surface, where the layers project at the level of the plane surface. The former surface is coated with a resin mask by photolithography process which takes place outside active regions of the heterostructure. An independent claim is also included for a method for fabricating a planar heterostructure.</p>
申请公布号 EP1041639(B1) 申请公布日期 2007.01.03
申请号 EP20000400703 申请日期 2000.03.14
申请人 FRANCE TELECOM 发明人 HERNANDEZ, CAROLINE;CAMPIDELLI, YVES;RIVOIRE, MAURICE;BENSAHEL, DANIEL
分类号 H01L29/165;H01L21/20;H01L21/205;H01L21/321;H01L21/336;H01L29/12;H01L31/0248;H01L31/0352;H01L31/072;H01L31/18;H01L33/24;H01L33/34;H01S5/02;H01S5/223;H01S5/30;H01S5/32 主分类号 H01L29/165
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