摘要 |
PURPOSE:To facilitate the easy generation of a test pattern and at the same time to secure the synchronization between the execution of an instruction and the test pattern, by describing a test pattern applied to an IC to be tested and a program which actuates said IC opposite to each other. CONSTITUTION:A test pattern applied to an IC 8 to be tested is described to a pattern field 92 of a source file 9 by an amount equal to the number of instruction executing clocks. The file 9 is supplied to an input control means 1 and converted into an internal formation. The means 1 supplies the number of rows of the instruction to be executed next from a simulator 2 and delivers data in a format equal to a pattern field 92. The means 3 reads the number of instruction executing clocks out of the simulator 2 and writes it to a pattern storage device 4 after the format conversion. An output control circuit 6 supplies the data on the device 4 and applies the data to the corresponding terminal of the IC 8. |