Electrical test probe

摘要

An electrical test probe in which spring biasing of the probe plunger is provided by the cooperative action of one or more laterally deflectable spring fingers cooperative with one or more angled surfaces. The plunger includes a ramped surface or surfaces which are cooperative with one or more spring fingers of a spring assembly and which are laterally movable to urge the plunger to a normally outward position. Alternatively, the spring assembly can be part of the movable plunger with the ramped surface or surfaces being fixed. The spring probe can be contained within a sleeve or can be mounted directly within an opening of a circuit board or other mounting member.