首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
APARATUS FOR MEASURING REFLECTION OF THE PLANAR SURFACES, IN PARTICULAR FLUCKERING METER
摘要
申请公布号
HU190892(B)
申请公布日期
1986.12.28
申请号
HU19830001277
申请日期
1983.04.13
申请人
MTA MUESZAKI FIZIKAI KUTATO INTEZETE,HU
发明人
KANTOR,MIHALY,HU;SCHANDA,JANOS,HU;MAKAI,JOZSEF,HU
分类号
G01N21/55;G01N21/57;(IPC1-7):G01N21/55
主分类号
G01N21/55
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Image forming apparatus
Method, system and apparatus for constructing fully personalized and contextualized user interfaces for terminals in mobile use
System and method for presenting time related data on a small screen device
System and method for delayed or repeated message delivery
Method for analyzing defect of SRAM cell
Current-perpendicular-to-the-plane structure magnetoresistive element having sufficient sensitivity
Carboxylic acid derivatives as IP antagonists
Compositions comprising at least one silicone, at least one compound comprising at least one ester group, and at least one copolymer, and methods for using the same
Layout verification based on probability of printing fault
Dual mode decoder
Decoder for pin-based scan test
Validating content of localization data files
Test apparatus and test method for testing a device under test
Wireless communication system
Memory system having stub bus configuration
Low-latency DC compensation
Locatable dielectric optical fiber cable having easily removable locating element
Minimizing windowing effects in particular for signal recovery
Arrangement for sharing a single signaling point code between multiple hosts in an IP-based network
Electronic apparatus having a vibration absorber