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发明名称
TEST PATTERN OF CMOS IMAGE SENSOR
摘要
申请公布号
KR20090046157(A)
申请公布日期
2009.05.11
申请号
KR20070112137
申请日期
2007.11.05
申请人
DONGBU HITEK CO., LTD.
发明人
LEE, SANG GI
分类号
H01L27/146;H01L27/148
主分类号
H01L27/146
代理机构
代理人
主权项
地址
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