发明名称
摘要 <p>PURPOSE:To measure in good accuracy without reference to dust stuck on scattering face, an irradiation window and an incidence window, etc., by providing a concave lens to the irradiation window of a multiplex scattering optical system and the incidence window for an optical sensor provided in correspondence to the irradiation window of a transmission optical system. CONSTITUTION:Each upper and lower head 1 and 2 is arranged in an opposite condition sandwiching between a paper 3 to be inspected. Through-holes 17, 18 of a rotatable sample holder 16 having the plural holes 17, 18 and standard samples 19, 20, are positioned on each irradiation window 4, 5 and intermittent light by a rotary sector 13 is irradiated to the paper 3. Measured light of a multiplex scattering optical system having a mutual action with the paper 3 and that of a transmission optical system, are detected by passing through an incidence window 6 of a sensor 12. A concave lens 31 is provided to the window 4 of this optical measurement system and projected light in a 2pi direction is made into the ideal scattered light and also, a concave lens 34 is provided to an incidence window 6. By this construction, an angle of a visual field from the sensor 12 is magnified and the detection of the scattered light is made easy and then, measured signal is obtained without affecting by sticking of dust etc.</p>
申请公布号 JPS6161625(B2) 申请公布日期 1986.12.26
申请号 JP19810071570 申请日期 1981.05.13
申请人 YOKOGAWA HOKUSHIN ELECTRIC 发明人 UEDA TAKESHI;KYOBE SEIICHIRO
分类号 G01N21/3559;G01N21/86 主分类号 G01N21/3559
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