发明名称 AUTOMATIC TEST METHOD FOR CIRCUIT
摘要 PURPOSE:To facilitate maintenance operation and to reduce circuit information memories to half by controlling circuit information only on a circuit exchange facility side and transferring information from the circuit exchange facility side on an automatic circuit testing facility side every time a circuit test is taken. CONSTITUTION:An automatic circuit test controller 1 send out a request (a) to inquire about circuit package information on only a specified route to the circuit exchange facilities 2 prior to a circuit test. The circuit exchange facilities 2 returns circuit package information (b) on said specified route to the automatic circuit test controller 1 in response to said request (a) to inquire. The automatic circuit test controller 1 stores the circuit package information (b) which is sent out of the circuit exchange facilities 2 in its internal circuit package information memory 1a. Then, the automatic circuit test controller 1 reads necessary circuit information out of the circuit package information memory 1a and sends the number of a circuit to be measured to a measuring instrument 3. The measuring instrument 3 sends out the specified number of the circuit to be measured to the circuit exchange facilities 2 and is connected to an outgoing trunk 4 corresponding to the circuit to be measured, thereby measuring the circuit automatically.
申请公布号 JPS61295747(A) 申请公布日期 1986.12.26
申请号 JP19850136932 申请日期 1985.06.25
申请人 NEC CORP;NEC ENG LTD 发明人 ISHII KENJI;SAITO TSUGIO
分类号 H04M3/26;H04M3/32 主分类号 H04M3/26
代理机构 代理人
主权项
地址