| 摘要 |
PURPOSE:To secure many test modes even with a small number of terminals by latching the input signals sent from other input/output terminals to obtain a test mode in response to the high voltage produced when the high voltage for setting a test is supplied from an input terminal. CONSTITUTION:A semiconductor integrated circuit functions as a known storage circuit as long as the voltage of a normal level is supplied to each terminal. While the voltage (set when a test mode is set) higher than the power supply voltage is supplied to a high voltage detecting circuit 41 via a control input terminal, a control signal phi is sent to a control signal latch circuit 43 from the circuit 41. Then a prescribed signal is supplied also from an input/output terminal synchronously with transmission of the signal phi. Thus a test mode setting signal is delivered from the circuit 43. When this test mode setting signal is supplied to a row decoder control circuit 33, for example, a word line full selection mode is set by a row decoder circuit 34. |
