发明名称 TESTER FOR ELECTRONIC CIRCUIT
摘要 PURPOSE:To enable a delicate inspection to be conducted by providing a counter to count the number of clock pulses. CONSTITUTION:When signals from a terminal TEST are at an 'H' level, T-FF2-4 upcount the number of the clock pulses of signals from a terminal TMODE and feed the binary numerals of LSB and MSB to a test control block C. The block C feeds out a signal group for changing over switches in a function block group G in response to input signals to the block C. Thus, the inspection of the block group G is perfectly conducted.
申请公布号 JPS61290375(A) 申请公布日期 1986.12.20
申请号 JP19850132339 申请日期 1985.06.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUZUKI SHIGETO
分类号 H01L21/66;G01R31/28;H01L21/822;H01L27/04 主分类号 H01L21/66
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