| 摘要 |
PURPOSE:To enable easy and accurate measurement of sample image by displaying a referential line of variable length and a character of converted length on sample corresponding with the length of said referential line. CONSTITUTION:In scanning type electron microscope, the currents to be fed to the horizontal and vertical deflection coils 40, 41 are switched through magni fication power switches 42, 43 to display a sample image 15 onto the display face 10 of CRT45 while magnification power indicator comprising referential line display means 70 is added. Then, a referential line 20 having variable length and scale lines M0-M2, a character of converted length (50mu, for example) on the sample image 15 corresponding with the referential line 20, magnifying power (X2,000, for example) and converted length (20mu, for example) on the sample corresponding with the scale width are displayed. Consequently, the sample image can be measured easily and quite accurately.
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