发明名称 配光特性測定装置および配光特性測定方法
摘要 A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing.
申请公布号 JP5944719(B2) 申请公布日期 2016.07.05
申请号 JP20120085508 申请日期 2012.04.04
申请人 大塚電子株式会社 发明人 江南 世志
分类号 G01J1/00 主分类号 G01J1/00
代理机构 代理人
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