| 摘要 |
PURPOSE:To eliminate the influence of the re-reflection, etc. of the scintillation light released to a sample side from a sample surface by forming layer which allows the transmission of radiation from the sample and prohibits the transmission of the light from the sample on the sample side surface. CONSTITUTION:The scintillation light is subjected to image pickup by an image pickup tube 4 of an image pickup device via an image pickup optical system 3 disposed on the opposite side of the sample 2. A metallic layer 1a consisting of aluminum, etc. is deposited by evaporation on one surface of the scintillator 1 to the thickness of the extent at which no influence is exerted to the transmission of the radiation. The scintillation light released to the sample 2 side is reflected uniformly by the surface of the layer 1a on the scintillator side and is returned to the image pickup side without arriving at the sample surface. The scintillation light released toward the optical system 3 side is imaged on a photoelectric surface 4a of the tube 4 by the optical system 3 by which the image is picked up. An image processing technique for uniformly removing the components below the specified level is applied to the image formed in the above-mentioned manner by which the video having the excellent resolution is obtd.
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