发明名称 FORMATION OF PATTERN
摘要 PURPOSE:To contrive the elimination of the load on the second coating silicon compound in the multilayer resist technique using a coating silicon compound for the second layer by obtaining the effect in using an adhesive assistant by forming a thin oxide film before forming the first organic substance layer, on the film to be processed. CONSTITUTION:A substantially thin oxide film 3 is formed, on a film to be processed 2, for example, of polysilicon which is formed on a semiconductor substrate 1, thereby obtaining the effect of hexamethyl disilazane as an adhesive assistant. This effect is characterized by making an oxide film 3 have plural methyl radicals and accordingly, after the treatment with hexamethyl disilazane, the bond between the oxide film 3 comprising methyl radicals and the first organic substance layer becomes strong and a distortion due to a heat treatment is reduced. Therefore, by the later steps, a good pattern without a crack of the coating silicon compound pattern 5' which is obtained at last can be formed stably.
申请公布号 JPS61285722(A) 申请公布日期 1986.12.16
申请号 JP19850126093 申请日期 1985.06.12
申请人 HITACHI LTD;HITACHI HARAMACHI SEMICONDUCTOR LTD 发明人 KIKUCHI MASAHIRO;MONMA NAOHIRO;OKANO SADAO;YAMADA KOICHIRO
分类号 H01L21/302;G03F7/26;H01L21/027;H01L21/30;H01L21/3065 主分类号 H01L21/302
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