发明名称 Method for obtaining full oxide isolation of epitaxial islands in silicon utilizing selective oxidation of porous silicon
摘要 Full oxide isolation of epitaxial islands can be accomplished by oxidizing suitably porous silicon. The porous silicon can be created by anodizing highly doped n+ silicon in hydroflouric acid. Lesser doped epitaxial regions will not become porous and will become isolated islands suitable for the fabrication of semiconductor devices.
申请公布号 US4628591(A) 申请公布日期 1986.12.16
申请号 US19840666698 申请日期 1984.10.31
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 ZORINSKY, ELDON J.;SPRATT, DAVID B.
分类号 H01L21/205;H01L21/306;H01L21/762;(IPC1-7):H01L21/306;H01L21/76 主分类号 H01L21/205
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