发明名称 |
SEMICONDUCTOR CHIP PACKAGES HAVING SOLDER LAYERS OF ENHANCED DURABILITY |
摘要 |
<p>SEMICONDUCTOR CHIP PACKAGES HAVING SOLDER LAYERS OF ENHANCED DURABILITY Solder layers in a semiconductor chip package, which electrically interconnect conductors used to gain electrical access to the electrodes on the semiconductor chip, are subjected to a transverse compressive force in excess of about 2 pounds per square inch. The semiconductor chip package can thereby undergo a marked increase in the number of cycles of heating and cooling before it falls due to increased thermal resistance arising from structural degradation of the solder layers.</p> |
申请公布号 |
CA1215474(A) |
申请公布日期 |
1986.12.16 |
申请号 |
CA19840459908 |
申请日期 |
1984.07.27 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
NEUGEBAUER, CONSTANTINE A.;CARLSON, RICHARD O. |
分类号 |
H01L23/02;H01L21/52;H01L23/04;H01L23/32;(IPC1-7):H01L23/02 |
主分类号 |
H01L23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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