| 摘要 |
The present invention is directed to an apparatus and method of testing the operability of probes used in performing workpiece probing operations. According to the preferred embodiment of the present invention, the probe has a first circuit for generating a first signal, the first signal inducing the probe to generate a second signal. A second circuit is provided for receiving the second signal. The second circuit is adapted to generate a third signal indicative of the operability of the probe when the second signal is received. In the preferred embodiment, an infrared signal is delivered by the apparatus to the probe causing the probe to emit an infrared signal. The infrared signal emitted by the probe is then used by the apparatus to generate an electrical signal indicative of the operability of the probe. |
