发明名称 Testing apparatus for redundant memory
摘要 Only that data which relates to detected failures of data stored in a memory under test is stored in a compressed data matrix of a small capacity which is determined by a predetermined number of redundant lines to be selected for remedy of the failures, and the selection of the redundant lines is effected during the execution of a test on the memory. Analysis leading to redundant line selection is effected on the data stored in this compressed matrix.
申请公布号 US4628509(A) 申请公布日期 1986.12.09
申请号 US19840609445 申请日期 1984.05.11
申请人 HITACHI, LTD. 发明人 KAWAGUCHI, IKUO
分类号 G06F11/20;G11C29/00;(IPC1-7):G06F11/20 主分类号 G06F11/20
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