发明名称 DEFECT DETECTING APPARATUS FOR PIN PIECE OF ELECTRONIC PART
摘要 PURPOSE:To detect bending and the like of a pin piece, by projecting a light beam at an approximately right angle with the aligning direction of the pin pieces, detecting the light beam, which is transmitted at the outside of the pin pieces as a one-dimensional image, and judging whether the interval between the images is within an allowable range or not. CONSTITUTION:Light beams from a light source 13 are made to be two light- beam groups by prisms 11 and 12. A part of the light beam group, which goes in the right direction, is shielded by pin pieces 4. The remaining light goes straight to the right direction. The light path is changed by a reflecting mirror 14. An image is formed on an image sensor 16 through a lens 15. Judgment of the defective pin piece is performed by the comparison of the waveforms of two pulses and judgment o the interval of the pulses. Thus, the positioning of a substrate is not required.
申请公布号 JPS61279143(A) 申请公布日期 1986.12.09
申请号 JP19850121681 申请日期 1985.06.05
申请人 NHK SPRING CO LTD 发明人 TAKASE HIROFUMI;MATSUMOTO TAKASHI;NISHIKUMA HIROAKI;MATSUMOTO HIROYUKI;YAMAGUCHI TOSHIHIKO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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