发明名称 SCREENING OF SEMICONDUCTOR
摘要 PURPOSE:To enable the screening of an oxide film of a capacitor portion to be performed, by applying a voltage to an outer lead and a lead frame with a tab hanging lead of a semiconductor linked to the lead frame without having adverse effect on other circuits in the semiconductor. CONSTITUTION:A tab hanging lead 11 supports a tab 13. Power source terminals VCC and VSS of a memory cell are connected to any of outer leads 10. Under such a condition, a negative voltage is applied to a lead frame 9 and 0 volt is applied to the outer lead 10 connected to the terminals VCC and VSS. With such an arrangement, a plurality of semiconductors connected to the frame 9 can be screened simultaneously. After the completion of the screening, an ordinary resin sealed type semiconductor can be obtained by cutting off the tab hanging lead 11 along a resin 12.
申请公布号 JPS61274279(A) 申请公布日期 1986.12.04
申请号 JP19850117051 申请日期 1985.05.30
申请人 TOSHIBA CORP 发明人 OTANI KOZO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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