| 摘要 |
PURPOSE:To eliminate the need for the operation of a selection switch in the sequential measurement for inspection items, by automatically selecting the voltage or current waveform at inspecting parts corresponding to the inspection items to make a display on a CRT. CONSTITUTION:A signal processing circuit 17 is provided between a computer 16 and a detector 10 and a signal selection circuit 18 and a CRT control circuit 19 between the computer 16 and a CRT 11. With a shift to new inspection items, first, a signal to be displayed on the CRT11 is selected in the measurement for inspection items to output a selection signal to a signal selection circuit 18 and the waveform of a corresponding signal is displayed on the CRT11 during the measurement processing (normally for several second) of the signal for the given inspection item. A separate time for observation of the display waveform is used with a limited time as for the items which require less time for the measurement processing with a short-time waveform display on the CRT11.
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