APPARATUS FOR SCANNING A TEST ELEMENT

摘要

Apparatus comprising a reflectometer (20) having a contact face (27) which contacts a test element (E) during scanning of the element (E). A removing means (50) is provided for firstly moving a scanned test element (E) and the contact face (27) out of contact with each other and then pushing the test element (E) away from the contact face (27) and out of the scanning position.