发明名称 |
Method of repairing semiconductor memory |
摘要 |
In a method of repairing a semiconductor memory device having spare lines, all possible solutions of remedy using spare lines or spare blocks are obtained based on the result of test for the device, and then the possible solutions are screened under conditions related to the quality and reliability of the device so as to determine the best solution. |
申请公布号 |
US4627053(A) |
申请公布日期 |
1986.12.02 |
申请号 |
US19840595411 |
申请日期 |
1984.03.30 |
申请人 |
HITACHI, LTD. |
发明人 |
YAMAKI, YOOJI;KASAI, SHIGENORI |
分类号 |
G11C29/00;G11C29/40;(IPC1-7):G01R31/28 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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