发明名称 INTERFEROMETER FOR MEASURING SURFACE SHAPE
摘要 PURPOSE:To measure the surface shape of an object surface with high accuracy by employing a shearing system and a fringe scanning system and erasing aberrations characteristic to an interferometer during an analysis of fringes. CONSTITUTION:Luminous flux from a laser light source 50 are passed through a light quantity adjuster 51 and a total reflecting mirror 52 and diverged by a diverging lens 53, and the light is reflected by a beam splitter 54 and collimated by a collimator 55 to illuminate the object surface 57 through a condenser lens 58. Reflected light from the object surface 57 travels backward and the beam splitter 58 transmits part of it and reflects the remainder; and the transmitted light is reflected by a total reflecting mirror 60 driven by a piezoelectric element 61 to return a beam splitter 58 and the reflected light, on the other hand, is shifted literally by a total reflecting mirror 59 to return the beam splitter 58, which superpose both light beams again, so that they interfere with each other. The luminous flux passes through a relay lens 62 and a total reflecting mirrors 63 to form interference fringes on an image pickup element 65, which converts the fringes into an electric signal of image information; and the signal is digitized by an A/D converter 66 and a computer 67 eliminates the remaining aberrations characteristic to the interferometer to compute the surface shape of the object surface 57.
申请公布号 JPS61272605(A) 申请公布日期 1986.12.02
申请号 JP19850114335 申请日期 1985.05.29
申请人 KYOCERA CORP 发明人 FURUSE MASASHI;MOROOKA TAKAYOSHI
分类号 G01B11/24;G01B9/02;G01J9/02;G01M11/00 主分类号 G01B11/24
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