发明名称 |
MANUFACTURE OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To improve the removing effect of a naturally oxidized material on the surface of a substrate and to improve the junction of later formed a-Si and the substrate by exposing the substrate continuously in the plasma of an inert gas such as N2 gas or Ar after heated in a vacuum. CONSTITUTION:A substrate 1 for manufacturing a semiconductor element is heated at a temperature of 200 deg.C-400 deg.C in a vacuum. The heated substrate 1 is exposed in an exposing process in the plasma of an inert gas such as N2 gas or Ar. Then, an amorphous silicon a-Si 2 is formed on the substrate 1 and an Au electrode 3 is provided on the a-Si 2. The removing effect on a naturally oxidized material on the surface of the substrate 1 is improved, the contact between the later formed a-Si 2 and the substrate 1 is improved to require no heat treatment after the formation of the a-Si 2 and the deterioration of the characteristics of the a-Si 2 is prevented. |
申请公布号 |
JPS61270817(A) |
申请公布日期 |
1986.12.01 |
申请号 |
JP19850112581 |
申请日期 |
1985.05.24 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NISHIO MIKIO;YANO KOSAKU;AOKI YOSHITAKA;YONEDA TADANAKA |
分类号 |
H01L31/04;H01L21/205 |
主分类号 |
H01L31/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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