| 摘要 |
PURPOSE:To enable an output for a circuit simulation to be simply and easily applied to a linear IC tester by providing an execution control table common to both a system for performing a circuit simulation and a linear IC test system. CONSTITUTION:A linear IC tester 1 applies a signal to and observe a socket board 2 which is an interface between a linear IC 3 which is an object to be measured and a linear IC tester 1. When an observed value is within an expected value range prepared in advance, the linear IC is a non-defective and when outside the range, a defective. These execution control processes are performed while the execution control program 7 of a microcomputer system 5 are referring to an execution control table 14. Thus, a test system practically utilizing a simulator and flexibly responding to a semiconductor device manufacturing process can be simply and easily realized. |
