发明名称 TEMPERATURE RISE TEST FOR TRANSFORMER
摘要 PURPOSE:To enable the temperature rise test of a transformer to be simply and accurately performed by short-circuiting a secondary winding in series and supplying a required current from a voltage to a primary winding side. CONSTITUTION:Star-connected secondary windings 2a and 2b are connected to each other in series through three short bars 3. Therefore, when a voltage is applied to a primary winding 1, current with the same strength flows in the secondary windings 2a and 2b through the short bars 3. That is, Ia=Ib. Thus, by connecting a plurality of secondary windings in series, an operation to be conducted in a test can be simplified and performed with a good accuracy without the necessity of using an impedance adjusting load.
申请公布号 JPS61269079(A) 申请公布日期 1986.11.28
申请号 JP19850111420 申请日期 1985.05.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 FURUBAYASHI NORIO
分类号 G01R31/06 主分类号 G01R31/06
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