发明名称 TWO-DIMENSIONAL MEASURING INSTRUMENT FOR EXTREMELY WEAK LIGHT EMISSION
摘要 PURPOSE:To measure a fluorescence attenuation time including two-dimensional position information by processing information on the incidence position of extremely weak light emission which is obtained by a two-dimensional incidence position detection tube and time information based upon reference time pulses synchronized with the excitation of fluorescence. CONSTITUTION:A sample 1 is excited repeatedly with the exciting light of a picosecond range. A fluorescent image with light emission intensity of single-photon level which is formed by materials distributed in the sample 1 is made incident on the two-dimensional incidence position detection tube 9. The information on the incidence position of the incident fluorescence is outputted from the output terminal of a semiconductor incidence position detector 9e and information corresponding to the point of time of the incidence is outputted from the electrode of a microchannel plate 9d. The two-dimensional position signal and time signal are inputted to a data processing part 16 and recorded. The position information is sectioned into units of, for example, 3X3 picture elements and the frequency of input of a single photon at each place is integrated with a quantized time unit to obtain data on a change with the lapse of time in the extremely weak fluorescence emission of the sample corresponding to said 3X3-picture-element unit.
申请公布号 JPS61266942(A) 申请公布日期 1986.11.26
申请号 JP19850108740 申请日期 1985.05.21
申请人 HAMAMATSU PHOTONICS KK 发明人 HIRAI NOBUYUKI;WATANABE MITSUO
分类号 G01N21/17;G01J1/00;G01J1/42;G01J1/58;G01N21/64 主分类号 G01N21/17
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