发明名称 |
TWO-DIMENSIONAL MEASURING INSTRUMENT FOR EXTREMELY WEAK LIGHT EMISSION |
摘要 |
PURPOSE:To measure a fluorescence attenuation time including two-dimensional position information by processing information on the incidence position of extremely weak light emission which is obtained by a two-dimensional incidence position detection tube and time information based upon reference time pulses synchronized with the excitation of fluorescence. CONSTITUTION:A sample 1 is excited repeatedly with the exciting light of a picosecond range. A fluorescent image with light emission intensity of single-photon level which is formed by materials distributed in the sample 1 is made incident on the two-dimensional incidence position detection tube 9. The information on the incidence position of the incident fluorescence is outputted from the output terminal of a semiconductor incidence position detector 9e and information corresponding to the point of time of the incidence is outputted from the electrode of a microchannel plate 9d. The two-dimensional position signal and time signal are inputted to a data processing part 16 and recorded. The position information is sectioned into units of, for example, 3X3 picture elements and the frequency of input of a single photon at each place is integrated with a quantized time unit to obtain data on a change with the lapse of time in the extremely weak fluorescence emission of the sample corresponding to said 3X3-picture-element unit.
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申请公布号 |
JPS61266942(A) |
申请公布日期 |
1986.11.26 |
申请号 |
JP19850108740 |
申请日期 |
1985.05.21 |
申请人 |
HAMAMATSU PHOTONICS KK |
发明人 |
HIRAI NOBUYUKI;WATANABE MITSUO |
分类号 |
G01N21/17;G01J1/00;G01J1/42;G01J1/58;G01N21/64 |
主分类号 |
G01N21/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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