发明名称 METHOD FOR THREE-DIMENSIONAL MEASUREMENT OF MATTER
摘要 PURPOSE:To make it possible to measure the spatial arrangement of matter at a high speed by one camera, by irradiating a plurality of slit lights preset in arrangement according to predetermined order. CONSTITUTION:The image of the matter irradiated with an illuminator 12 is picked by a camera 1 and the output thereof is converted to a digital signal which is, in turn, inputted to an image processor 15. This input signal is processed by a density processing part 16 to be stored in an image memory 21 as an image A wherein the contour of the matter was extracted. Next, a scanning region is calculated from the obtained data and the selection of a slit light source and the determination of the scanning region are subsequently performed on the basis of the calculation result. Thereafter, the illuminator 12 is turned OFF and a selected slit light source is lighted to irradiate slit light and the slit light image on the matter is picked up to extract the center line thereof and stored in an image memory 22 as an image B. Succeedingly, the data of the images A, B are read from the image memories 21, 22 and the slit image corresponding to the slit light image is extracted by an inter- image AND operation part 20 and the coordinates thereof are stored in a buffer 26. Subsequently, a distance is calculated by a distance calculation part 25.
申请公布号 JPS61265510(A) 申请公布日期 1986.11.25
申请号 JP19850107676 申请日期 1985.05.20
申请人 FUJITSU LTD 发明人 MARUYAMA TSUGIHITO;KANDA SHINJI
分类号 G01B11/24;G01B11/00;G01C15/00;G05B19/19 主分类号 G01B11/24
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