发明名称 METHOD FOR DETECTING POSTURE ANGLE BY PATTERN
摘要 PURPOSE:To make it possible to automatically detect the relative position to a pattern with good accuracy, by respectively measuring the positional shifts of two sets of marks present at opposed positions with respect to the center of a circle in the specific axial direction crossing a glance direction at right angles. CONSTITUTION:A pattern wherein circular marks 1-4 having an almost same diameter are present at quartered positions on the circumference of a circle having a radius r0 is assumed to be present so that the center of a circle wherein the marks 1-4 are arranged on the x', y'-plane of the x', y', z' rotary coordinates system allowed to take an arbitrary posture by imparting the rotation around each coordinates axis to a x, y, z fixed coordinates system is allowed to coincide with the origin of the rotary coordinates system. The coordinates of the marks 1, 2 in the x', y', z'-rotary coordinates system are respectively set to P1', P2' and converted to the coordinates P1, P2 in the x, y, z-fixed coordinates system to calculate the coordinates values of the coordinates P1, P2. Then, when the positional shifts P31, P42 of the marks 1, 3 and 2, 4 in the axial direction crossing a glance direction at right angles are respectively measured to take the ratio (r) thereof, r=tan theta is formed. The posture angle thetaof the pattern can be detected on the basis of the ratio (r).
申请公布号 JPS61265523(A) 申请公布日期 1986.11.25
申请号 JP19850107750 申请日期 1985.05.20
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 TAKANO HIDEHIKO
分类号 G01B21/24;G01B11/26;G01B21/22 主分类号 G01B21/24
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