发明名称 EDDY CURRENT FLAW INSPECTING METHOD AND ITS DEVICE
摘要 PURPOSE:To perform eddy current flaw inspection effectively by allowing a material to be examined to pass the flaw detecting part of a rotating coil type eddy current flaw inspector to inspect flaws after giving an alternating magnetic field to the material to be examined, which passes through a degausser consisting of a through type coil, by this degausser to degauss it. CONSTITUTION:A material supply base 1 drops arranged and prepared bar materials to be examined onto a carrying device 2 horizontally at every specified time one by one. This device 2 has many rolls whose outside peripheral surfaces having V-shaped grooves are provided on, and dropped materials to be examined are carried in a uniform speed in the direction of an arrow. A degausser 4 consists of the through type coil and gives the alternating magnetic field to materials to be examined, which pass through the degausser 4, to degauss them. Materials to be examined after degaussing pass the inside of a flaw inspecting part 3 of the rotating coil type eddy current flaw inspector and flaws are inspected in this stage. Materials to be examined are dropped to a defective goods frame 5 or an indefectible goods frame 6 in accordance with the results.
申请公布号 JPS61264251(A) 申请公布日期 1986.11.22
申请号 JP19850105228 申请日期 1985.05.17
申请人 HITACHI METALS LTD 发明人 MATSUTANI HIROSHI;KATO MIKIO
分类号 G01N27/90 主分类号 G01N27/90
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