发明名称 FORMING METHOD OF RESIST PATTERN
摘要 PURPOSE:To form an accurate resist pattern by forming a resist layer which gradually decreases in containing light absorber density in a surface direction from the coating surface, exposing and developing the layer. CONSTITUTION:A resist layer 3 is coated on the upper surface of the aluminum layer 2 on a silicon wafer 1. A light absorber 4 s contained in the layer 3, and higher the density is, the nearer the layer 2 is disposed to the surface of the layer 2, and lower the density is, the layer 2 is nearer to the surface of the layer 3. When the layer 3 is exposed, the reflected light on the surface of the exposed light arrived at the surface of the layer 2 is absorbed and removed by a light absorber 4 of high density. Thus, an accurate resist pattern can be formed.
申请公布号 JPS61263219(A) 申请公布日期 1986.11.21
申请号 JP19850103798 申请日期 1985.05.17
申请人 HITACHI LTD;HITACHI MICRO COMPUT ENG LTD 发明人 NOZAKI KATSUHIRO;KADOTA KAZUYA;SATO FUMIYOSHI;SUGIMOTO ARITOSHI;OZAKI KATSUMI
分类号 G03F7/26;H01L21/027;H01L21/30 主分类号 G03F7/26
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