发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a semiconductor device which has less damage of the upper electrode of a source with less thermal resistance by escaping gap when forming a small hole at the upper electrode of a viahole and forming the viahole through a pellet. CONSTITUTION:An FET active layer 2, a gate electrode 3, an insulating protective film 4, a drain ohmic electrode 5, a drain upper electrode 6, a source ohmic electrode 7 and a source upper electrode 8 are formed on a semi-insulating GaAs substrate 1 to form a window 9a of a source upper electrode to become a viahole. After an upper electrode protective film 10 is coated on the portion except the window 9a, a viahole 11 is formed by etching, and a back surface electrode 12 is formed. Then, after a back surface electrode protective film 13 is formed, a hole 9 is formed at the electrode 12 directly under the window 9a, and the films 10, 13 are removed.
申请公布号 JPS61263284(A) 申请公布日期 1986.11.21
申请号 JP19850105504 申请日期 1985.05.17
申请人 NEC CORP 发明人 UEDA KAZUYOSHI
分类号 H01L29/812;H01L21/338;H01L21/60;H01L29/80 主分类号 H01L29/812
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