发明名称 Vapor deposition method for the GaAs thin film.
摘要 A vapor phase deposition method for the GaAs thin film is disclosed, which is characterized in that, in the metal organic chemical vapor deposition method (MOCVD method) wherein arsine gas and organic gallium gas are decomposed thermally and GaAs crystals are allowed to deposit onto the GaAs substrate, for the deposition of n-type conductive GaAs crystals, arsine gas and organic gallium gas are supplied at such a supplying ratio (V/III) as p-type conductive GaAs crystals are deposited unless an impurity is added intentionally and gas of the compounds of VI group elements is added to these gases to make n-type conductive GaAs crystals having a carrier density of not less than 1x1016 cm-3.
申请公布号 EP0201933(A2) 申请公布日期 1986.11.20
申请号 EP19860106679 申请日期 1986.05.15
申请人 THE FURUKAWA ELECTRIC CO., LTD. 发明人 KOJIMA, SEIJI;IKEDA, MASAKIYO;KIKUCHI, HIROSHI;KASHIWAYANAGI, YUZO
分类号 C30B25/02;H01L21/205 主分类号 C30B25/02
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