| 摘要 |
PURPOSE:To execute a highly speedy test by changing over and outputting a signal to measure whether or not outputs of plural memory cells are coincident to written data and the signal selected from plural reading signals. CONSTITUTION:When a change-over signal phi1 is L and is in operation usually, an AND circuit 110 is opened through an inverter 109, an OR circuit 108, the reading output of plural memory cells from a memory array 101 is selected and outputted through the circuit 110. On the other hand, when the signal phi1 is H and the test action is executed, a gate 110 is opened through an OR circuit 107. Deciding results L and H outputted by an exclusive OR circuit 106 in accordance with respective the coincidence and the dissidence of the reading output of plural memory cells in which the same writing signal phi2 is written and the signal phi2 are outputted through circuits 108 and 110, and by the simultaneous processing of plural memory cells, the highly speedy test of the memory cell array can be executed without providing the output data pin, the output pad, etc.
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