| 摘要 |
PURPOSE:To obtain in a short time an image which has reflected an optional chemical shift quantity, even in case of chemical shift imaging, by correcting a phase error caused by ununiformity of a static magnetic field, and a phase offset peculiar to a device. CONSTITUTION:An inspecting device is constituted of a coil 4 for generating a high frequency magnetic field, and simultaneously, detecting a signal generated from an object 16, coils 8, 9 and 10 for generating an inclined magnetic field, a coil 14 for generating a static magnetic field, and a computer 1 having storage devices 19, 20, etc. In such a state, a chemical shift image is derived by the operation from plural pieces of images obtained by setting the interval of a 90 deg. high frequency pulse and a 180 deg. high frequency pulse so that it is different from the interval of the 180 deg. high frequency pulse and an echo signal, and the ununiform distribution of a static magnetic field of a part or the whole of an inspecting object area. In such a process, the phase offset peculiar to a device is detected from the phase of a part of a reference sample provided in the vicinity of the coil 4, or the object 16, so that an exact chemical shift image can be derived. |
