发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE OF THE SAME |
摘要 |
PURPOSE:To avoid a soft error caused by an alpha-ray by forming an alpha-ray countermeasure semiconductor region by utilizing a mask used for forming a contact hole for direct contact in an insulation film. CONSTITUTION:A mask 16 for etching and introducing an impurity is formed on the predetermined parts of a field insulation film 2 and an insulation film 4. After the exposed part of the insulation film 4 is removed to form a contact hole 5 for direct contact, the mask 16 is removed. Then a conductive layer 7A and a conductive layer 7B are formed and a semiconductor region 8 is formed. An N-type semiconductor region 9 is formed in the main surface part of a semiconductor substrate 1 by utilizing the conductive layers 7A and 7B and the field insulation film 2 as masks for introducing an impurity. A mask 10 for introducing an impurity is formed to form an N<+> type semiconductor region 11 and a P<+> type semiconductor region (an alpha-ray countermeasure semiconductor region) 12. With this constitution, a soft error of a semiconductor integrated circuit device which has a memory function can be avoided. |
申请公布号 |
JPS61258470(A) |
申请公布日期 |
1986.11.15 |
申请号 |
JP19850099579 |
申请日期 |
1985.05.13 |
申请人 |
HITACHI LTD |
发明人 |
IKEDA SHUJI;MEGURO SATOSHI;MOTOYOSHI MAKOTO;MINATO OSAMU |
分类号 |
G11C11/34;H01L21/8234;H01L21/8242;H01L21/8244;H01L27/088;H01L27/10;H01L27/11 |
主分类号 |
G11C11/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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