发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
<p>PURPOSE:To completely enhance a reading margin without depending on a power source potential by comparing with a predetermined comparison potential to detect the data of a double gate type ROM element. CONSTITUTION:A floating gate of a transistor Mc of a potential generating circuit 30 of a comparison potential generating circuit 20 is brought to a neutral state. A potential variation owing to a variation of a power source voltage Vc of a nodal point Bc is equivalent to a cbange of a potential VBa1 owing to the variation of a voltage VCC of a nodal point Ba when ROM cells M11-Mmn of a double gate transistor in which the floating gate is brought to the neutral state. Similarly, the potential of a nodal point Bd of a comparison potential generating circuit 40 is equivalent to the variation of a potential VBa2 of the nodal point Ba when the cells M11-Mmn in which an electric charge flows in the floating gate. These nodal points Bc and Bd are connected by the transistor of a resistance component. A potential of a comparison voltage output nodal point D to a sense amplifier SA goes to an intermediate value of the potentials VBa1, VBa2. The reading margin of the ROM becomes high without depending on the power source potential.</p> |
申请公布号 |
JPS61255597(A) |
申请公布日期 |
1986.11.13 |
申请号 |
JP19850096335 |
申请日期 |
1985.05.07 |
申请人 |
TOSHIBA CORP;TOSHIBA MICRO COMPUT ENG CORP |
发明人 |
IWAHASHI HIROSHI;ASANO MASAMICHI;MINAGAWA EISHIN |
分类号 |
G11C17/00;G11C16/06 |
主分类号 |
G11C17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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