发明名称 WAFER ATTRACTION SENSOR
摘要 PURPOSE:To certainly sense if a wafer is attracted by allowing compressed air to jet along the inner wall of the body of a conical Bernoulli chuck, and thereby changing the pressure in the space between the Bernoulli chuck body and the wafer attracted. CONSTITUTION:When a solenoid valve 8 is opened, compressed air with a specified pressure, which is set by a pressure regulator 9, is supplied to a nozzle 3 and jets out along the inner wall of the body 1 to produce an attraction force directed upward. Thereby a wafer 5 situated in the position shown by the broken line is attracted by the body 1 and reaches the position shown by the solid line. This movement of wafer 5 changes the pressure at Point A (negative) greatly, that is transmitted to a pressure sensor 10 through a sensor tube 11. Thereby the pressure sensor 10 compares the pressure at Point A with the preset value and emits an electrically converted signal to indicate if wafer 5 is in attraction. This performance is independent from the material, surface condition and attitude of the wafer as well as eventual attachment of wafer drops to the wafer.
申请公布号 JPS61254436(A) 申请公布日期 1986.11.12
申请号 JP19850093842 申请日期 1985.05.02
申请人 MITSUBISHI ELECTRIC CORP 发明人 IMAMURA MASAMITSU
分类号 B65H3/14;B25J15/06;B65G49/07;B65H3/08 主分类号 B65H3/14
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