发明名称 Method of making an isolation slot for integrated circuit structure
摘要 The invention comprises an improved isolation slot in an integrated circuit structure which minimizes damage to the silicon substrate. The improved isolation slot is formed by etching a slot in the substrate of an integrated circuit structure; depositing a buffer layer in the slot adjacent the walls of the slot; and forming an isolation oxide layer in the slot over the buffer layer; whereby the presence of the buffer layer between the substrate and the isolation oxide minimizes damage to the substrate by the oxide. In a preferred embodiment, the buffer layer comprises polysilicon which is partially oxidized to form the isolation oxide layer. A barrier layer is formed between the slot walls and the polysilicon buffer layer to electrically insulate the polysilicon from the adjoining integrated circuit structure.
申请公布号 US4621414(A) 申请公布日期 1986.11.11
申请号 US19850707728 申请日期 1985.03.04
申请人 ADVANCED MICRO DEVICES, INC. 发明人 IRANMANESH, ALI
分类号 H01L21/762;H01L21/763;(IPC1-7):H01L21/31;H01L21/302;H01L21/76 主分类号 H01L21/762
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