发明名称 |
Method of making an isolation slot for integrated circuit structure |
摘要 |
The invention comprises an improved isolation slot in an integrated circuit structure which minimizes damage to the silicon substrate. The improved isolation slot is formed by etching a slot in the substrate of an integrated circuit structure; depositing a buffer layer in the slot adjacent the walls of the slot; and forming an isolation oxide layer in the slot over the buffer layer; whereby the presence of the buffer layer between the substrate and the isolation oxide minimizes damage to the substrate by the oxide. In a preferred embodiment, the buffer layer comprises polysilicon which is partially oxidized to form the isolation oxide layer. A barrier layer is formed between the slot walls and the polysilicon buffer layer to electrically insulate the polysilicon from the adjoining integrated circuit structure.
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申请公布号 |
US4621414(A) |
申请公布日期 |
1986.11.11 |
申请号 |
US19850707728 |
申请日期 |
1985.03.04 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
IRANMANESH, ALI |
分类号 |
H01L21/762;H01L21/763;(IPC1-7):H01L21/31;H01L21/302;H01L21/76 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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