| 摘要 |
PURPOSE:To decrease the number of steps needed for the formation of elements and to realize such elements at a lower price by a method wherein a wiring pattern for the evaluation of element characteristics is formed beforehand on an insulating sub strate and the element characteristics are determined prior to the separation of the insulating substrate from the elements. CONSTITUTION:On a sapphire insulating substrate 12, wherein a wiring pattern 11 formed of gold or the like by means of metallizing is positioned at a prescribed loca tion, substrates 13, made of Hg.Cd.Te and cut into dimensions suitable for the forma tion of elements, are arranged into prescribed groups and bonded to the insulating substrate 12 by using an adhesive agent. On the substrate 13, an In film is formed by evaporation, except at a region for a light-receiving plane 14, for the formation of an electrode 15. Next, by means of mask evaporation, a junction film 16 is so formed as to connect to the electrode 15 and wiring pattern 11. The wiring pattern 11 spreads as far as the periphery of the insulating substrate 12 whereat connection is established with a test equipment for the determination of the performance char acteristics of the respective elements with the intermediary of the wiring pattern 11. In this design, testing is completed with the number of testing steps decreased, which in turn reduces manhours needed for the formation of elements. |
