| 摘要 |
PURPOSE:To reduce the consumption of a chromate treatment liquid and the variance in the quality of a treated metallic strip by measuring a chromate treated film in accordance with the difference in the intensity value measured by fluorescent X-ray method from the metallic strip before and after the execution of the chromate treatment. CONSTITUTION:Fluorescent X-ray analyzing instruments 3 and 4 are respectively provided on the inlet side and outlet side of the treating layer for subjecting the metallic strip 1 under continuous movement to the chromate treatment. The fluorescent X-rays are generated from the strip 1 and are detected by a detector 32 when an X-ray source 31 irradiates the excitation X-rays on the strip in accordance with the signal from a controller 51 connected to a process computer 6. The X-rays are converted to an electric signal which is fed to an amplifier 33. The signal is converted to the inlet side intensity by a pulse height analyzer 34 and a counter 35. The computer 6 tracks the measured point on the strip 1 and feeds a signal to the controller 51 when the points arrive at the outlet side. The output from the controller 51 is fed to an X-ray source 41 on the outlet side and is converted similarly to the outlet side intensity via an amplifier 43, a pulse height analyzer 44 and a counter 45. A calculator 52 determines the intensity difference between the inlet side and outlet side, calculates the content of chromium in the chromate treated film and displays the same on a display device 53. |
