发明名称 METHOD FOR DEVELOPING RESIST
摘要 PURPOSE:To obtain a fine pattern high in resolution by using a developing soln. contg. fatty acid esters in the specified b.p. range for developing a positive type radiation resist contg. a copolymer of a specified styrene type monomer and a specified acrylate type monomer. CONSTITUTION:The positive type radiation resist contains a copolymer of repeating units each represented by formula I and those each represented by formula II, and in these formulae, R<1>, R<2>, R<3> are each halogen, lower alkyl, lower haloalkyl, OH, CN NH2 or the like, R<4> is lower alkyl, lower haloalkyl, or CN, and R<5> is lower alkyl, lower haloalkyl, aryl, or aralkyl. This resist is developed with a developing soln. contg. fatty acid ester in the b.p. range of 70-180 deg.C alone or in its mixture at room temp. thus permitting an image high in contrast to be formed.
申请公布号 JPS61249049(A) 申请公布日期 1986.11.06
申请号 JP19850091510 申请日期 1985.04.26
申请人 KURARAY CO LTD 发明人 SUGITA KAZUYUKI;UENO NOBUO;SASAKI SHIGERU;OSADA SHIRO
分类号 G03C1/72;G03F7/039;G03F7/30;G03F7/32 主分类号 G03C1/72
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