| 摘要 |
The invention relates to a system for measuring the length of resistor ladders, consisting of at least one resistor ladder (RB) on which a measurement point (PCU) is located, the position of which is measured in the longitudinal direction of the resistor ladder (XPOS) and in a preferred embodiment is also measured perpendicularly and obliquely with respect to the direction of the resistor ladder by determining the subresistances (RB1 + RB2 = RB) on both sides of the measurement point, in particular in a contactless fashion. For this purpose, in accordance with the prior art, a voltage injection into the resistor ladder is made at the measurement point and a measuring device is connected to the resistor ladder on both sides of the measuring point. The object of the present invention is to perform the most accurate measurement possible, to obtain a measurement result for the length measurement which is independent of sources and sinks occurring along the course of the resistor used for the resistance measurement, also of coupling capacitances of the measuring device, of the internal resistance of the signal feed used and, if appropriate, of temperature influences. This technical object is achieved by a simulation network which is connected to the resistor ladder on both sides of the measuring point and which, ... by compensating by means of a fed manipulated variable on both sides of the measuring point or voltage injection of the measuring point, ... corresponding conducting properties of the resistor ladders used for the length measurement or ... on both sides of the ... Original abstract incomplete. <IMAGE>
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