LOG SCANNING IN VENEER LATHE TO DETERMINE OPTIMUM YIELD AXIS

摘要

Apparatus is disclosed for scanning a log with light or other electromagnetic radiation while such log is rotated by the spindles of a veneer lathe to determine its optimum yield axis and for positioning the log with positioning arms to align such optimum yield axis with the lathe spindle axis. The scanning means detects light reflected from the log or light transmitted past the side of a log to determine its optimum yield axis. The positioning arms are mounted on support arms having a horizontal sliding pivot at one end thereof to provide vertical and horizontal adjustment of the positioning arms in response to positioning motors. The positioning motors move the positioning arms to align the optimum yield axis of the log with the lathe spindle axis and are controlled by the output of a computer which determines the optimum yield axis.