| 摘要 |
PURPOSE:To make the measurement of the substance to be measured as it is kept in an operation state possible, by a method wherein the actual absorbance of substance to be measured is measured and the amount of substance to be measured is calculated by comparing it with the memorized working curve representing the relation between the amount of specified substance to be measured and the absorbance. CONSTITUTION:An apparatus 10 for irradiation of infrared rays and detection of reflected light is movably arranged parallel to the axis A of plate cylinder 1 near the plate surface of lithography, infrared rays being irradiated by the signal of trigger circuit 35 moving it with a driving apparatus 20 and the absorbance signal S5 is inputted to a control circuit 40. Further, for the peripheral directional position of lithography 2, a bar code 4 is detected with a detector 22 and the axial directional position is obtained by a driving signal S2. Then, the control circuit 40 compares the data of the substance to be measured specified by the signal S1 from an indication circuit 34 with the absorbance detection signal S5 and calculates the mass of the material 3 to be measured by reading the working curve representing the relation between the amount preliminarily memorized in a memory part 32 and the absorbance. Thus, the control circuit 40 automatically controls the amounts of picture forming substance or the like on the basis of this result. |
