| 摘要 |
PURPOSE:To reduce the test time, by setting the subsequent quantity of light condition while a testing is carried out. CONSTITUTION:When a quantity of light condition setting instruction is sent to a quantity of light condition controlling circuit 2 from a central control circuit 1, the circuit 2 reads a set quantity of light value out of a set quantity of light value memory circuit 4 to hold it. When a light emitting instruction, a driving instruction and an output processing instruction are sent to the quantity of light controlling circuit 2, a driving circuit 6 and an output signal processing circuit 8 respectively from the central control circuit 1, the quantity of light controlling circuit 2 sends the set quantity of light value held to a quantity of light setting circuit 3 to drive a light emitting circuit 5 emitting light and the driving circuit 6 drives a photoelectric conversion element 7 to be tested, the output of which is processed with an output signal circuit 8. Immediately after sending the set quantity of light value to the circuit 3, the circuit 2 reads the subsequent set quantity of light value out of the circuit 4 to hold it.
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