| 摘要 |
PURPOSE:To obtain a correct X-ray defraction even for an unstable sample, by providing a thin film separated from the surface of a sample by more than fixed, distance lest the reflected X rays should be detected through the thin film. CONSTITUTION:When performing a measurement to crystallographically characterizing material with an X-ray defractometer using a black blender 1 concentration method, a thin film 3 is used which is made of a material small in the capacity of passing steam, oxygen carbon dioxide, a volatile component or a substitution gas while having the capacity of passing X-rays. The thin film 3 is arranged separated by more than fixed distance from the surface of a sample 4 by lifting it with a window frame 2 lest the reflected X-rays should be detected with a detector through the thin film 3 to cover the sample 4 thereby assuring a correct X-ray defraction graphic. |
