发明名称 |
Method of forming a dielectric layer on a semiconductor device |
摘要 |
A method for forming a substantially planar inorganic dielectric layer over a predetermined pattern of electrical interconnects comprises the steps of reacting phosphoric acid and a trivalent metallic halide compound with an aliphatic solvent to form a coating fluid. The coating fluid is then spun onto the semiconductor device to form a layer over the electrical interconnect. The resultant device is then baked at a first temperature to drive off the solvent and then baked at a second, higher temperature, in order to promote the glass forming reaction. This process is repeated as required to form a coating layer having a thickness which exhibits levelling characteristics of such high quality that fine topography can be carried out on succeeding layers of metal in order to form additional interconnect layers with precision.
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申请公布号 |
US4619839(A) |
申请公布日期 |
1986.10.28 |
申请号 |
US19840680878 |
申请日期 |
1984.12.12 |
申请人 |
FAIRCHILD CAMERA & INSTRUMENT CORP. |
发明人 |
LEHRER, WILLIAM I. |
分类号 |
H01L21/316;H01L21/768;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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