发明名称 METHOD AND DEVICE FOR DISPLAYING MAGNIFICATION OF SAMPLE IMAGE
摘要 PURPOSE:To enable length of the sample image to be accurately measured by displaying a reference scale which divides a reference line with a given length according to magnification and displaying the length on the sample image corresponding to one graduation of the reference scale by a character. CONSTITUTION:A reference line 20 having a constant length is displayed on a display screen 10 for a scanning type electron microscope or a similar device. A reference scale (M) is displayed which has mark (M1) which moves between the end points (M0) and (M2) according to magnification. The length on a sample image 15 corresponding to one graduation of the reference scale (M) is displayed by a character. The height of the reference scale (M) is varied according to magnification. Necessary information is displayed on a CRT45 by the use of a reference line displayer 50, a scale displayer 60 and a character displayer 70. Accordingly, length of the sample image can be accurately measured and its vertical length can also be measured.
申请公布号 JPS61240545(A) 申请公布日期 1986.10.25
申请号 JP19850080249 申请日期 1985.04.17
申请人 AKASHI SEISAKUSHO CO LTD 发明人 KIMURA TAKASHI;KOSEKI TETSUO
分类号 H01J37/22;G01B11/02;H01J37/28 主分类号 H01J37/22
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