发明名称 |
METHOD AND DEVICE FOR DISPLAYING MAGNIFICATION OF SAMPLE IMAGE |
摘要 |
PURPOSE:To enable length of the sample image to be accurately measured by displaying a reference scale which divides a reference line with a given length according to magnification and displaying the length on the sample image corresponding to one graduation of the reference scale by a character. CONSTITUTION:A reference line 20 having a constant length is displayed on a display screen 10 for a scanning type electron microscope or a similar device. A reference scale (M) is displayed which has mark (M1) which moves between the end points (M0) and (M2) according to magnification. The length on a sample image 15 corresponding to one graduation of the reference scale (M) is displayed by a character. The height of the reference scale (M) is varied according to magnification. Necessary information is displayed on a CRT45 by the use of a reference line displayer 50, a scale displayer 60 and a character displayer 70. Accordingly, length of the sample image can be accurately measured and its vertical length can also be measured.
|
申请公布号 |
JPS61240545(A) |
申请公布日期 |
1986.10.25 |
申请号 |
JP19850080249 |
申请日期 |
1985.04.17 |
申请人 |
AKASHI SEISAKUSHO CO LTD |
发明人 |
KIMURA TAKASHI;KOSEKI TETSUO |
分类号 |
H01J37/22;G01B11/02;H01J37/28 |
主分类号 |
H01J37/22 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|