发明名称 HANDLER DEVICE FOR INSPECTING IC PRODUCT
摘要 PURPOSE:To eliminate the need for the positioning of a measuring operator, and to automate the titled device by capturing the packaging external form of an IC product, the shape of an IC lead and printed characters on the IC product in plane pictures, A/D converting an output and comparing the output with a previously inputted reference data. CONSTITUTION:Printed characters on the surface of an IC product are read from an image pickup device 3, and transmitted over a processor 2. A stopper device 5 is driven in response to a signal, and brought into contact with a tester conductor 8, thus inspecting the IC product. The shape of IC Leads and a packaging external form are also photographed, signals 53, 54, 56 are outputted in response to the results of comparisons with a shape reference data memory of the shapes of the IC leads, and a lifting gear 57 is lifted when there is a defect, and the IC product is not positioned, and is carried directly to a selector 9. A positioning processor outputs the signal 53 in an IC product having no defect, the stopper is adjusted at a specified position, an IC product circuit is combined, and a tester is operated, thus inspecting the IC product. Acceptables and defectives are carried to respective housing section.
申请公布号 JPS61237444(A) 申请公布日期 1986.10.22
申请号 JP19850079965 申请日期 1985.04.15
申请人 TOKYO EREKUTORON KK 发明人 KURONO YOICHI;INOUE JUNICHI
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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